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MICRO   2007 IEEE/ACM International Symposium on Microarchitecture
Wall of Fame | Most Viewed MICRO-2007 Paper
MICRO
2007
IEEE
188views Hardware» more  MICRO 2007»
14 years 5 months ago
Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
Jangwoo Kim, Nikos Hardavellas, Ken Mai, Babak Fal...
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