214 search results - page 8 / 43 » Improved Boundary Scan Design |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...
CGA
2008
13 years 10 months ago
2008
The rapid evolution of automatic shape acquisition technologies will make huge amount of sampled 3D data available in the near future. Cultural Heritage (CH) domain is one of the ...
CIKM
2008
Springer
13 years 11 months ago
2008
Springer
Traditional workload management methods mainly focus on the current system status while information about the interaction between queued and running transactions is largely ignore...
IWMM
2011
Springer
13 years 21 days ago
2011
Springer
At the heart of all garbage collectors lies the process of identifying and processing reference fields within an object. Despite its key role, and evidence of many different impl...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
When developing new designs, debugging the prototype is important to resolve application malfunction. During this board design debug, often a few pins of an IC are measured to che...