2201 search results - page 27 / 441 » Improvement of ASIC Design Processes |
ASAP
2008
IEEE
14 years 2 months ago
2008
IEEE
Process technology has reduced in size such that it is possible to implement complete applicationspecific architectures as Systems-on-Chip (SoCs) using both Application-Specific I...
METRICS
2003
IEEE
14 years 23 days ago
2003
IEEE
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testabil...
FPL
2005
Springer
14 years 1 months ago
2005
Springer
In many industrial processes, an incorrect operation can lead to irreparable damage to people, equipment, or the environment. In order to reduce risks, the electronic control syst...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
HPCC
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. Low-power design became crucial with the widespread use of the embedded systems, where a small battery has to last for a long period. The embedded processors need to efï¬...