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146
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ITC
2002
IEEE
15 years 11 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
187
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
143
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ICASSP
2011
IEEE
14 years 10 months ago
2011
IEEE
This paper proposes a class of Hilbert transform pairs of orthonormal wavelet bases with improved analyticity. To improve the analyticity of complex wavelet, a different allpass ...
138
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ISBI
2006
IEEE
16 years 7 months ago
2006
IEEE
Focal cortical dysplasia (FCD), a malformation of cortical development, is an important cause of intractable epilepsy. On Magnetic Resonance Images (MRI), FCD lesions are difficul...
158
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ICDAR
2009
IEEE
16 years 29 days ago
2009
IEEE
The recognition of handwritten characters, words, and text arouses great interest today. To develop the best working system is subject of many papers published. With this paper, m...