— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
Functional programming languages ought to play a central role in mathematics education for middle schools (age range: 10?14). After all, functional programming is a form of algebr...
Matthias Felleisen, Robert Bruce Findler, Matthew ...
In this effort, we propose a new image fusion technique, utilizing Empirical Mode Decomposition (EMD), for improved face recognition. EMD is a non-parametric datadriven analysis t...
Harishwaran Hariharan, Andreas Koschan, Besma R. A...
To reduce the cost of regression testing, software testers may prioritize their test cases so that those which are more important, by some measure, are run earlier in the regressi...
Sebastian G. Elbaum, Alexey G. Malishevsky, Gregg ...