1503 search results - page 35 / 301 » Improving Student Performance Using Self-Assessment Tests |
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
ATS
2004
IEEE
14 years 17 days ago
2004
IEEE
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
ICFP
2009
ACM
14 years 9 months ago
2009
ACM
Functional programming languages ought to play a central role in mathematics education for middle schools (age range: 10?14). After all, functional programming is a form of algebr...
ICIP
2006
IEEE
2006
IEEE
Fusion of Visible and Infrared Images using Empirical Mode Decomposition to Improve Face Recognition
14 years 10 months ago
In this effort, we propose a new image fusion technique, utilizing Empirical Mode Decomposition (EMD), for improved face recognition. EMD is a non-parametric datadriven analysis t...
TSE
2002
13 years 8 months ago
2002
To reduce the cost of regression testing, software testers may prioritize their test cases so that those which are more important, by some measure, are run earlier in the regressi...