259 search results - page 39 / 52 » Improving coverage analysis and test generation for large de... |
CLUSTER
2002
IEEE
13 years 7 months ago
2002
IEEE
The need to conduct and manage large sets of experiments for scientific applications dramatically increased over the last decade. However, there is still very little tool support ...
BMCBI
2005
13 years 7 months ago
2005
Background: Gene duplication and gene loss during the evolution of eukaryotes have hindered attempts to estimate phylogenies and divergence times of species. Although current meth...
DAC
2010
ACM
13 years 10 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
ICPADS
2002
IEEE
14 years 13 days ago
2002
IEEE
Network emulation systems are widely used to explore the behavior of network protocols and to test and evaluate protocol implementations and applications. The major problem of net...
AINA
2007
IEEE
14 years 1 months ago
2007
IEEE
The widening gap between CPU and memory speed has made caches an integral feature of modern highperformance processors. The high degree of configurability of cache memory can requ...