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ICST
2010
IEEE
13 years 6 months ago
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...
TSE
2010
197views more  TSE 2010»
13 years 2 months ago
A Genetic Algorithm-Based Stress Test Requirements Generator Tool and Its Empirical Evaluation
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
Vahid Garousi
DATE
2006
IEEE
108views Hardware» more  DATE 2006»
14 years 1 months ago
Automatic march tests generations for static linked faults in SRAMs
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Gi...
CAV
2010
Springer
201views Hardware» more  CAV 2010»
13 years 11 months ago
Contessa: Concurrency Testing Augmented with Symbolic Analysis
Testing of multi-threaded programs poses enormous challenges. To improve the coverage of testing, we present a framework named CONTESSA that augments conventional testing (concrete...
Sudipta Kundu, Malay K. Ganai, Chao Wang
UML
2004
Springer
14 years 25 days ago
The AGEDIS Tools for Model Based Testing
We describe the tools and interfaces created by the AGEDIS project, a European Commission sponsored project for the creation of a methodology and tools for automated model driven ...
Alan Hartman, Kenneth Nagin