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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
13 years 12 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
COMPSAC
2001
IEEE
13 years 11 months ago
Scenario-Based Functional Regression Testing
Regression testing has been a popular quality assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based fu...
Raymond A. Paul, Lian Yu, Wei-Tek Tsai, Xiaoying B...
ICASSP
2008
IEEE
14 years 2 months ago
Speech denoising using nonnegative matrix factorization with priors
We present a technique for denoising speech using nonnegative matrix factorization (NMF) in combination with statistical speech and noise models. We compare our new technique to s...
Kevin W. Wilson, Bhiksha Raj, Paris Smaragdis, Aja...
BMCBI
2008
120views more  BMCBI 2008»
13 years 7 months ago
Statistical issues in the analysis of Illumina data
Background: Illumina bead-based arrays are becoming increasingly popular due to their high degree of replication and reported high data quality. However, little attention has been...
Mark J. Dunning, Nuno L. Barbosa-Morais, Andy G. L...
MEDINFO
2007
116views Healthcare» more  MEDINFO 2007»
13 years 9 months ago
Improving Computer Aided Disease Detection Using Knowledge of Disease Appearance
The accurate quantification of disease patterns in medical images allows radiologists to track the progress of a disease. Various computer vision techniques are able to automatica...
Tatjana Zrimec, James S. J. Wong