295 search results - page 11 / 59 » In-Parameter-Order: A Test Generation Strategy for Pairwise ... |
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ICTAC
2004
Springer
14 years 2 months ago
2004
Springer
Abstract. The classical work on test case generation and formal methods focuses either on algebraic or model-based specifications. In this paper we propose an approach to derive t...
EVOW
2011
Springer
13 years 5 days ago
2011
Springer
The Strategy Game Description Game Language (SGDL) is intended to become a complete description of all aspects of strategy games, including rules, parameters, scenarios, maps, and ...
VTS
1996
IEEE
14 years 25 days ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
ACL
2006
13 years 10 months ago
2006
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...