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VTS
1995
IEEE
94views Hardware» more  VTS 1995»
14 years 6 days ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
ICASSP
2011
IEEE
13 years 12 days ago
Intra-session variability compensation and a hypothesis generation and selection strategy for speaker segmentation
This paper addresses the problem of speaker segmentation in two-speaker telephone conversations, using an eigenvoice based factor analysis approach. We present a set of improvemen...
Carlos Vaquero, Alfonso Ortega, Eduardo Lleida
IPPS
1998
IEEE
14 years 28 days ago
Meta-heuristics for Circuit Partitioning in Parallel Test Generation
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...
Consolación Gil, Julio Ortega, Antonio F. D...
GECCO
2007
Springer
276views Optimization» more  GECCO 2007»
14 years 2 months ago
Automatic mutation test input data generation via ant colony
Fault-based testing is often advocated to overcome limitations of other testing approaches; however it is also recognized as being expensive. On the other hand, evolutionary algor...
Kamel Ayari, Salah Bouktif, Giuliano Antoniol
KBSE
2005
IEEE
14 years 2 months ago
An analysis of rule coverage as a criterion in generating minimal test suites for grammar-based software
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
Mark Hennessy, James F. Power