811 search results - page 94 / 163 » Incremental Regression Testing |
VTS
2000
IEEE
14 years 2 days ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
JMLR
2008
13 years 7 months ago
2008
Pointwise consistent, feasible procedures for estimating contemporaneous linear causal structure from time series data have been developed using multiple conditional independence ...
ITC
2003
IEEE
14 years 29 days ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
GCB
2009
Springer
13 years 11 months ago
2009
Springer
Abstract: It is often challenging to reconstruct accurately a complete dynamic biological network due to the scarcity of data collected in cost-effective experiments. This paper ad...
OOPSLA
2004
Springer
14 years 1 months ago
2004
Springer
This paper reports on the design and implementation of Chianti, a change impact analysis tool for Java that is implemented in the context of the Eclipse environment. Chianti analy...