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GLVLSI
2006
IEEE
101views VLSI» more  GLVLSI 2006»
14 years 24 days ago
Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...
CAISE
2006
Springer
13 years 10 months ago
Compliant and Flexible Business Processes with Business Rules
When modeling business processes, we often implicity think of internal business policies and external regulations. Yet to date, little attention is paid to avoid hard-coding polici...
Stijn Goedertier, Jan Vanthienen
PODC
1989
ACM
13 years 10 months ago
A Structural Induction Theorem for Processes
Robert P. Kurshan, Kenneth L. McMillan
ALT
2006
Springer
14 years 3 months ago
The Complexity of Learning SUBSEQ (A)
Higman showed that if A is any language then SUBSEQ(A) is regular, where SUBSEQ(A) is the language of all subsequences of strings in A. We consider the following inductive inferenc...
Stephen A. Fenner, William I. Gasarch