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DATE
2000
IEEE
132views Hardware» more  DATE 2000»
15 years 6 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
RSP
2005
IEEE
15 years 8 months ago
Test-Time, Run-Time, and Simulation-Time Temporal Assertions in RSP
For cost-effective prototyping, system designers should have a clear understanding of the intended use of the prototype under development. This paper describes a classification of...
Doron Drusinsky, Man-tak Shing, Kadir Alpaslan Dem...
DAGM
2007
Springer
15 years 8 months ago
Selection of Local Optical Flow Models by Means of Residual Analysis
Abstract. This contribution presents a novel approach to the challenging problem of model selection in motion estimation from sequences of images. New light is cast on parametric m...
Björn Andres, Fred A. Hamprecht, Christoph S....
KBSE
2003
IEEE
15 years 7 months ago
What Test Oracle Should I Use for Effective GUI Testing?
Test designers widely believe that the overall effectiveness and cost of software testing depends largely on the type and number of test cases executed on the software. In this pa...
Atif M. Memon, Ishan Banerjee, Adithya Nagarajan
BIRTHDAY
2006
Springer
15 years 6 months ago
Optimal Flow Distribution Among Multiple Channels with Unknown Capacities
Consider a simple network flow problem in which there are n channels directed from a source to a sink. The channel capacities are unknown and we wish to determine a feasible netwo...
Richard M. Karp, Till Nierhoff, Till Tantau