962 search results - page 16 / 193 » Input validation analysis and testing |
JIPS
2010
13 years 2 months ago
2010
Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios whi...
ITC
1997
IEEE
13 years 12 months ago
1997
IEEE
- An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two metho...
IEEEPACT
2002
IEEE
14 years 21 days ago
2002
IEEE
Having a representative workload of the target domain of a microprocessor is extremely important throughout its design. The composition of a workload involves two issues: (i) whic...
PTS
2000
13 years 9 months ago
2000
Coverage analysis of programs and specifications is a common approach to measure the quality and the adequacy of a test suite. This paper presents a probe insertion technique for m...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
Abstract--A novel input and output biasing circuit to extend the input common mode (CM) voltage range and the output swing to rail-to-rail in a low voltage op-amp in standard CMOS ...