962 search results - page 52 / 193 » Input validation analysis and testing |
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
VLSID
2000
IEEE
14 years 1 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
CSO
2009
IEEE
14 years 3 months ago
2009
IEEE
With the development of modern electronic and computer technologies, sports training and competition became more and more technical. A great deal of data were recorded, including ...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
TSE
2010
13 years 3 months ago
2010
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...