3028 search results - page 423 / 606 » Integrating Temporal Logics |
154
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TSMC
2010
14 years 11 months ago
2010
Traditional planning assumes reachability goals and/or full observability. In this paper, we propose a novel solution for safety and reachability planning with partial observabilit...
148
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ISQED
2011
IEEE
14 years 8 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
130
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VLDB
2005
ACM
15 years 10 months ago
2005
ACM
Modern computer work stations provide thousands of applications that store data in >100.000 files on the file system of the underlying OS. To handle these files data process...
176
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CIKM
2010
Springer
15 years 2 months ago
2010
Springer
Schema merging is the process of consolidating multiple schemas into a unified view. The task becomes particularly challenging when the schemas are highly heterogeneous and autono...
144
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...