855 search results - page 29 / 171 » Integration Testing of Composite Applications |
KDD
2000
ACM
13 years 11 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
JSW
2007
13 years 7 months ago
2007
— Providing powerful and fine-grained capabilities for the analysis and management of non-functional properties is a major challenge for component-based software systems. This a...
ACII
2005
Springer
14 years 1 months ago
2005
Springer
This paper proposes an alternative paradigm for building affective competencies in embodied conversational agents (ECAs). The key feature of this approach -- and the reason for ref...
ICSOC
2009
Springer
13 years 5 months ago
2009
Springer
Ad-hoc and situational applications for personal use will gain more and more traction in the work support for knowledge workers (KWers). Personal information is a key element in th...