1548 search results - page 235 / 310 » Integration of Simulation with Enterprise Models |
IEEECIT
2005
IEEE
14 years 4 months ago
2005
IEEE
In embedded systems, performance and power are important inter-related issues that cannot be decoupled. Expensive and extensive simulations in a processor design space are usually...
VLSID
2000
IEEE
14 years 3 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
CONTEXT
1999
Springer
14 years 3 months ago
1999
Springer
Appeared in: P. Bouquet, P. Br´ezillon, L. Serafini, M. Benerecetti, F. Castellani (Eds.), 2nd International and Interdisciplinary Conference on Modeling and Using Context (CONT...
WSC
2008
14 years 1 months ago
2008
Semiconductor fabs often offer manufacturing service of multiple priorities in terms of cycle time-based X-factor targets (XFTs) and fab production must be planned accordingly. Th...
WSC
2004
14 years 14 days ago
2004
The authors present the requirement definition and methodological approach for developing a new generation of Computer Generated Forces (CGF) based on Intelligent Agents. The anal...