1928 search results - page 292 / 386 » Integrity Constraints in OWL |
DDECS
2007
IEEE
14 years 4 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
DFT
2007
IEEE
14 years 4 months ago
2007
IEEE
The network-on-chip (NoC) paradigm is seen as a way of facilitating the integration of a large number of computational and storage blocks on a chip to meet several performance and...
EDOC
2007
IEEE
14 years 4 months ago
2007
IEEE
There has, in recent years, been growing interest in Model Driven Engineering (MDE), in which models are the primary design artifacts and transformations are applied to these mode...
GLVLSI
2007
IEEE
14 years 4 months ago
2007
IEEE
Regularly structured design techniques can combat complexity on a variety of fronts. We present the Structured and Tuned Array Generation (STAG) design methodology, which provides...
ICC
2007
IEEE
14 years 4 months ago
2007
IEEE
— Key management has long been a challenging problem in wireless Distributed Sensor Networks (DSNs) due to their high security requirements and strict resource constraints. Recen...