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ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
ICDE
2008
IEEE
14 years 8 months ago
2008
IEEE
Abstract-- The use of atomic commit protocols in mobile adhoc networks involves difficulties in setting up reasonable timeouts for aborting a pending distributed transaction. This ...
CAIP
2009
Springer
14 years 2 months ago
2009
Springer
Abstract. Dynamic Programming (DP) is a popular and efficient method for calculating disparity maps from stereo images. It allows for meeting real-time constraints even on low-cos...
ISCC
2000
IEEE
13 years 12 months ago
2000
IEEE
CEAS
2006
Springer
13 years 11 months ago
2006
Springer
Our research group has developed new, stateof-the-art antispam software, described in other papers. We are in the process of deploying that software in a large production corporat...