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VTS
1995
IEEE
94views Hardware» more  VTS 1995»
13 years 11 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
ISSRE
2006
IEEE
14 years 1 months ago
Metamodel-based Test Generation for Model Transformations: an Algorithm and a Tool
In a Model-Driven Development context (MDE), model transformations allow memorizing and reusing design know-how, and thus automate parts of the design and refinement steps of a so...
Erwan Brottier, Franck Fleurey, Jim Steel, Benoit ...
PASTE
2005
ACM
14 years 1 months ago
Generalizing symbolic execution to library classes
Forward symbolic execution is a program analysis technique that allows using symbolic inputs to explore program executions. The traditional applications of this technique have foc...
Sarfraz Khurshid, Yuk Lai Suen
FASE
2009
Springer
14 years 2 months ago
Reducing the Costs of Bounded-Exhaustive Testing
Abstract. Bounded-exhaustive testing is an automated testing methodology that checks the code under test for all inputs within given bounds: first the user describes a set of test...
Vilas Jagannath, Yun Young Lee, Brett Daniel, Dark...
ET
2000
145views more  ET 2000»
13 years 7 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar