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ICCAD
2002
IEEE
176views Hardware» more  ICCAD 2002»
14 years 6 months ago
High capacity and automatic functional extraction tool for industrial VLSI circuit designs
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
Sasha Novakovsky, Shy Shyman, Ziyad Hanna
CGO
2010
IEEE
14 years 4 months ago
Large program trace analysis and compression with ZDDs
Prior work has shown that reduced, ordered, binary decision diagrams (BDDs) can be a powerful tool for program trace analysis and visualization. Unfortunately, it can take hours o...
Graham D. Price, Manish Vachharajani
SEFM
2008
IEEE
14 years 4 months ago
Nullness Analysis in Boolean Form
Attempts to dereference null result in an exception or a segmentation fault. Hence it is important to know those program points where this might occur and prove the others (or the...
Fausto Spoto
ATVA
2007
Springer
136views Hardware» more  ATVA 2007»
14 years 3 months ago
Symbolic Fault Tree Analysis for Reactive Systems
Fault tree analysis is a traditional and well-established technique for analyzing system design and robustness. Its purpose is to identify sets of basic events, called cut sets, wh...
Marco Bozzano, Alessandro Cimatti, Francesco Tappa...
COCOA
2007
Springer
14 years 3 months ago
On Threshold BDDs and the Optimal Variable Ordering Problem
Abstract. Many combinatorial optimization problems can be formulated as 0/1 integer programs (0/1 IPs). The investigation of the structure of these problems raises the following ta...
Markus Behle