1295 search results - page 30 / 259 » Layered manufacturing technologies |
IJBIS
2010
13 years 4 months ago
2010
: The increasing intensity of global competition and the rapid advances in information technology (IT) have led organisations to search for more efficient and effective ways to man...
CODES
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
HOST
2009
IEEE
13 years 11 months ago
2009
IEEE
A PUF or Physical Unclonable Function is a function that is embodied in a physical structure that consists of many random uncontrollable components which originate from process var...
TVLSI
2008
13 years 7 months ago
2008
-- Aggressive CMOS scaling results in low threshold voltage and thin oxide thickness for transistors manufactured in deep submicron regime. As a result, reducing the subthreshold a...
INTEGRATION
2008
13 years 7 months ago
2008
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...