Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
Compared with the traditional sequential design method, concurrent engineering is a systematic approach to integrate concurrent design of products and their related processes. One...
ct 7 An increasingly frequent application of Machine Vision technologies is in automated surface inspection for the detection of defects in 8 manufactured products. Such systems oï...
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson,...
With the advancement in user-centric and URI-based identity systems over the past two years, it has become clear that a single specification will not be the solution to all proble...