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    TODAES
    2008
    42views more  TODAES 2008»
    Layout-aware scan chain reorder for launch-off-shift transition test coverage
    13 years 10 months ago
    Layout-aware scan chain reorder for launch-off-shift transition test coverage
    Download  vlsilab.cs.nchu.edu.tw
    Sying-Jyan Wang, Kuo-Lin Peng, Kuang-Cyun Hsiao, K...
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    ASPDAC
    2007
    ACM
    107views Hardware» more  ASPDAC 2007»
    A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture
    14 years 2 months ago
    A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture
    Download  www.cecs.uci.edu
    Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...
    Seongmoon Wang, Wenlong Wei
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