2 search results - page 1 / 1 » Layout-aware scan chain reorder for launch-off-shift transit... |
TODAES
2008
15 years 2 months ago
2008
120
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ASPDAC
2007
ACM
15 years 7 months ago
2007
ACM
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...