37 search results - page 8 / 8 » Leakage Current Reduction in VLSI Systems |
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...