6715 search results - page 12 / 1343 » Learning from a Test Set |
JMLR
2006
13 years 7 months ago
2006
While methods for comparing two learning algorithms on a single data set have been scrutinized for quite some time already, the issue of statistical tests for comparisons of more ...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
BMCBI
2006
13 years 7 months ago
2006
Background: Various statistical and machine learning methods have been successfully applied to the classification of DNA microarray data. Simple instance-based classifiers such as...
GECCO
2003
Springer
14 years 17 days ago
2003
Springer
Learning Bayesian networks from data has been studied extensively in the evolutionary algorithm communities [Larranaga96, Wong99]. We have previously explored extending some of the...
CORR
2006
Springer
13 years 7 months ago
2006
Springer
We investigate here concept learning from incomplete examples. Our first purpose is to discuss to what extent logical learning settings have to be modified in order to cope with da...