209 search results - page 5 / 42 » Learning from defect removals |
IDA
2007
Springer
13 years 7 months ago
2007
Springer
Unsupervised sequence learning is important to many applications. A learner is presented with unlabeled sequential data, and must discover sequential patterns that characterize th...
AICCSA
2006
IEEE
13 years 9 months ago
2006
IEEE
In this paper we apply a machine learning approach to the problem of estimating the number of defects called Regression via Classification (RvC). RvC initially automatically discr...
VIS
2004
IEEE
14 years 8 months ago
2004
IEEE
We present a novel surface reconstruction algorithm that can recover high-quality surfaces from noisy and defective data sets without any normal or orientation information. A set ...
CGI
2003
IEEE
14 years 27 days ago
2003
IEEE
We present a new method for the restoration of digitized photographs. Restoration in this context refers to removal of image defects such as scratches and blotches as well as to r...
ECCV
2008
Springer
14 years 9 months ago
2008
Springer
We propose a novel method for removing irrelevant frames from a video given user-provided frame-level labeling for a very small number of frames. We first hypothesize a number of c...