2778 search results - page 125 / 556 » Limit complexities revisited |
111
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EVOW
2008
Springer
15 years 6 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
140
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ESANN
2007
15 years 6 months ago
2007
We apply kernel-based machine learning methods to online learning situations, and look at the related requirement of reducing the complexity of the learnt classifier. Online meth...
152
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IADIS
2004
15 years 6 months ago
2004
Construction kits represent a venerable, creative, and (occasionally) even beautiful genre of educational toys for children. Nonetheless, traditional construction kits have limita...
136
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ISMB
1994
15 years 6 months ago
1994
Multiple sequence alignment has been a useful methodin the study of molecular evolution and sequence-structure relationships. This paper presents a newmethodfor multiple sequence ...
161
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WCE
2007
15 years 5 months ago
2007
—Building a time series forecasting model by independent component analysis mechanism presents in the paper. Different from using the time series directly with the traditional A...