1117 search results - page 5 / 224 » Local Detection Of Defects From Image Sequences |
AADEBUG
2005
Springer
14 years 1 months ago
2005
Springer
AMPLE locates likely failure-causing classes by comparing method call sequences of passing and failing runs. A difference in method call sequences, such as multiple deallocation ...
DAGM
2009
Springer
13 years 5 months ago
2009
Springer
Abstract. Automatic visual inspection has become an important application of pattern recognition, as it supports the human in this demanding and often dangerous work. Nevertheless,...
ICPR
2006
IEEE
14 years 8 months ago
2006
IEEE
Recent research in object recognition has demonstrated the advantages of representing objects and scenes through localized patterns such as small image templates. In this paper we...
BIS
2007
13 years 9 months ago
2007
Abstract. Use cases are a popular way of specifying functional requirements of computer-based systems. Each use case contains a sequence of steps which are described with a natural...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...