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IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
14 years 4 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
ICPR
2002
IEEE
14 years 11 months ago
Prototype Selection for Finding Efficient Representations of Dissimilarity Data
The nearest neighbor (NN) rule is a simple and intuitive method for solving classification problems. Originally, it uses distances to the complete training set. It performs well, ...
Elzbieta Pekalska, Robert P. W. Duin
IPPS
2007
IEEE
14 years 4 months ago
An optimistic checkpointing and selective message logging approach for consistent global checkpoint collection in distributed sy
In this paper, we present an asynchronous consistent global checkpoint collection algorithm which prevents contention for network storage at the file server and hence reduces the...
Qiangfeng Jiang, D. Manivannan
ICDM
2007
IEEE
129views Data Mining» more  ICDM 2007»
14 years 2 days ago
Feature Selection for Nonlinear Kernel Support Vector Machines
An easily implementable mixed-integer algorithm is proposed that generates a nonlinear kernel support vector machine (SVM) classifier with reduced input space features. A single ...
Olvi L. Mangasarian, Gang Kou
EMNLP
2008
13 years 11 months ago
Selecting Sentences for Answering Complex Questions
Complex questions that require inferencing and synthesizing information from multiple documents can be seen as a kind of topicoriented, informative multi-document summarization. I...
Yllias Chali, Shafiq R. Joty