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DFT
2002
IEEE
115views VLSI» more  DFT 2002»
14 years 20 days ago
Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
Sagar S. Sabade, D. M. H. Walker
CVPR
2008
IEEE
14 years 9 months ago
Object tracking and detection after occlusion via numerical hybrid local and global mode-seeking
Given an object model and a black-box measure of similarity between the model and candidate targets, we consider visual object tracking as a numerical optimization problem. During...
Zhaozheng Yin, Robert T. Collins
ECCV
2008
Springer
14 years 9 months ago
Local Regularization for Multiclass Classification Facing Significant Intraclass Variations
We propose a new local learning scheme that is based on the principle of decisiveness: the learned classifier is expected to exhibit large variability in the direction of the test ...
Lior Wolf, Yoni Donner
CLUSTER
2004
IEEE
13 years 11 months ago
A comparison of local and gang scheduling on a Beowulf cluster
Gang Scheduling and related techniques are widely believed to be necessary for efficientjob scheduling on distributed memory parallel computers. This is hecause they minimize cont...
Peter E. Strazdins, John Uhlmann
MM
2006
ACM
152views Multimedia» more  MM 2006»
14 years 1 months ago
Local image representations using pruned salient points with applications to CBIR
Salient points are locations in an image where there is a significant variation with respect to a chosen image feature. Since the set of salient points in an image capture import...
Hui Zhang, Rouhollah Rahmani, Sharath R. Cholleti,...