2299 search results - page 161 / 460 » Logical Data Expiration |
145
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ASPDAC
2007
ACM
15 years 8 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
124
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ISSA
2004
15 years 5 months ago
2004
This paper describes a high data rate 8-bit Crypto Processor based on Advanced Encryption Standard (Rijndael algorithm). Though the algorithm requires 32-bit wide data path but ou...
151
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CORR
2010
Springer
15 years 1 months ago
2010
Springer
Our work concerns the elucidation of the cancer (epi)genome, transcriptome and proteome to better understand the complex interplay between a cancer cell's molecular state and ...
111
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EMSOFT
2009
Springer
15 years 10 months ago
2009
Springer
In this paper, we propose a formal analysis approach to estimate the expected (average) data cache access time of an application across all possible program inputs. Towards this g...
146
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LICS
2007
IEEE
15 years 10 months ago
2007
IEEE
d abstract) Marcin Jurdzi´nski and Ranko Lazi´c∗ Department of Computer Science, University of Warwick, UK An alternation-free modal µ-calculus over data trees is introduced ...