980 search results - page 143 / 196 » Logical Testing |
DAC
2010
ACM
14 years 1 days ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
FTCS
1998
13 years 10 months ago
1998
Programs fail mainly for two reasons: logic errors in the code, and exception failures. Exception failures can account for up to 2/3 of system crashes [6], hence are worthy of ser...
EACL
1993
ACL Anthology
13 years 10 months ago
1993
ACL Anthology
The first part of the paper develops a novel, sortally-based approach to the problem of aspectual composition. The account is argued to be superior on both empirical and computati...
CIIA
2009
13 years 9 months ago
2009
In this paper, we present a new synthesis feature namely, "Xor matching", and the foldback product term synthesis for Complex Programmable Logic Devices (CPLD) architectu...
TCAD
2002
13 years 8 months ago
2002
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...