980 search results - page 179 / 196 » Logical Testing |
ASPLOS
2009
ACM
14 years 9 months ago
2009
ACM
Although chip-multiprocessors have become the industry standard, developing parallel applications that target them remains a daunting task. Non-determinism, inherent in threaded a...
PODS
2008
ACM
14 years 8 months ago
2008
ACM
We present a novel definition of privacy in the framework of offline (retroactive) database query auditing. Given information about the database, a description of sensitive data, ...
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
PLDI
2009
ACM
14 years 3 months ago
2009
ACM
Symbolic analysis shows promise as a foundation for bug-finding, specification inference, verification, and test generation. This paper addresses demand-driven symbolic analysi...
KBSE
2003
IEEE
14 years 1 months ago
2003
IEEE
Physics-based animation programs can often be modeled in terms of hybrid automata. A hybrid automaton includes both discrete and continuous dynamical variables. The discrete varia...