980 search results - page 39 / 196 » Logical Testing |
DAGSTUHL
2004
13 years 9 months ago
2004
Although computer systems penetrate all facets of society, the software running those systems may contain many errors. Producing high quality software appears to be difficult and v...
RE
2004
Springer
14 years 29 days ago
2004
Springer
Most problems in building and refining a system can be traced back to errors in requirements. Poorly organized requirements, most often in natural language are among the major ca...
ET
2002
13 years 7 months ago
2002
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
DAC
2000
ACM
13 years 12 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...