980 search results - page 48 / 196 » Logical Testing |
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
CSL
2004
Springer
14 years 1 months ago
2004
Springer
Locality notions in logic say that the truth value of a formula can be determined locally, by looking at the isomorphism type of a small neighborhood of its free variables. Such n...
AAAI
2000
13 years 9 months ago
2000
Just as actions can have indirect effects on the state of the world, so too can sensing actions have indirect effects on an agent's state of knowledge. In this paper, we inve...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
COMPSAC
2003
IEEE
14 years 28 days ago
2003
IEEE
Usual techniques for automatic test data generation are based on the assumption that a complete oracle will be available during the testing process. However, there are programs fo...