980 search results - page 52 / 196 » Logical Testing |
TVLSI
2002
13 years 7 months ago
2002
Gate diffusion input (GDI)--a new technique of low-power digital combinatorial circuit design--is described. This technique allows reducing power consumption, propagation delay, an...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
GLOBECOM
2008
IEEE
13 years 7 months ago
2008
IEEE
Security is a critical issue in dynamic and open distributed environments such as network-based services or wireless networks. To ensure that a certain level of security is maintai...
GECCO
2009
Springer
14 years 2 months ago
2009
Springer
Most of the software developed in the world follows the object-oriented (OO) paradigm. However, the existing work on evolutionary testing is mainly targeted to procedural language...
ET
2002
13 years 7 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...