980 search results - page 64 / 196 » Logical Testing |
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
Unit testing component-based distributed systems traditionally involved testing functional concerns of the application logic throughout the development lifecycle. In contrast, tes...
DLOG
2009
13 years 5 months ago
2009
Abstract. GridTest is a framework for testing automated theorem provers using randomly generated formulas. It can be used to run tests locally, in a single computer, or in a comput...
ISMVL
2007
IEEE
14 years 1 months ago
2007
IEEE
Designing modern circuits comprised of millions of gates is a very challenging task. Therefore new directions are investigated for efficient modeling and verification of such syst...
ICTAC
2009
Springer
13 years 5 months ago
2009
Springer
Testing from first-order specifications has mainly been studied for flat specifications, that are specifications of a single software module. However, the specifications of large s...