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ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
14 years 5 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha
GLVLSI
2005
IEEE
152views VLSI» more  GLVLSI 2005»
14 years 1 months ago
A high speed and leakage-tolerant domino logic for high fan-in gates
Robustness of high fan-in domino circuits is degraded by technology scaling due to exponential increase in leakage. In this paper, we propose a new domino circuit for high fan-in ...
Farshad Moradi, Hamid Mahmoodi-Meimand, Ali Peirav...
JSAI
2005
Springer
14 years 1 months ago
Learning Stochastic Logical Automaton
Abstract. This paper is concerned with algorithms for the logical generalisation of probabilistic temporal models from examples. The algorithms combine logic and probabilistic mode...
Hiroaki Watanabe, Stephen Muggleton
ROBOCUP
1999
Springer
95views Robotics» more  ROBOCUP 1999»
14 years 11 days ago
Spatial Agents Implemented in a Logical Expressible Language
In this paper, we present a multi-layered architecture for spatial and temporal agents. The focus is laid on the declarativity of the approach, which makes agent scripts expressive...
Frieder Stolzenburg, Oliver Obst, Jan Murray, Bj&o...
ITC
1995
IEEE
122views Hardware» more  ITC 1995»
13 years 11 months ago
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
Stefan Weiner