102 search results - page 13 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
SENSYS
2010
ACM
13 years 6 months ago
2010
ACM
As sensor network technologies become more mature, they are increasingly being applied to a wide variety of applications, ranging from agricultural sensing to cattle, oceanic and ...
ASPDAC
2001
ACM
14 years 7 days ago
2001
ACM
Ethernet communication devices, such as adapter, hub, bridge and switch, all follow IEEE 802.3 standard protocol. We have designed and implemented an integrated 10/100 Mbps Etherne...
EDM
2009
13 years 6 months ago
2009
Traditional data mining techniques have been extensively applied to find interesting patterns, build descriptive and predictive models from large volumes of data accumulated throug...
CCS
2011
ACM
12 years 8 months ago
2011
ACM
Paper forgery is among the leading causes of corruption in many developing regions [2]. In this paper, we introduce PaperSpeckle, a robust system that leverages the natural random...
EURODAC
1994
IEEE
14 years 21 days ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...