102 search results - page 4 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
COMPSAC
1999
IEEE
13 years 11 months ago
1999
IEEE
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
DAC
2003
ACM
14 years 21 days ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
OOPSLA
2010
Springer
13 years 5 months ago
2010
Springer
This poster presents a design language and a tool suite covering the development life-cycle of a Sense/Compute/Control (SCC) application. This language makes it possible to define...
CVPR
2012
IEEE
11 years 10 months ago
2012
IEEE
Undoubtedly, a key feature in the popularity of smartmobile devices is the numerous applications one can install. Frequently, we learn about an application we desire by seeing it ...
DFT
1997
IEEE
13 years 11 months ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...