2 search results - page 1 / 1 » Low-cost run-time diagnosis of hard delay faults in the func... |
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
MICRO
2005
IEEE
14 years 1 months ago
2005
IEEE
We develop a microprocessor design that tolerates hard faults, including fabrication defects and in-field faults, by leveraging existing microprocessor redundancy. To do this, we...