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    ISCAS
    1999
    IEEE
    124views Hardware» more  ISCAS 1999»
    Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity
    13 years 11 months ago
    Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity
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    Patrick Girard, Loïs Guiller, Christian Landr...
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    TCAD
    2002
    134views more  TCAD 2002»
    DS-LFSR: a BIST TPG for low switching activity
    13 years 7 months ago
    DS-LFSR: a BIST TPG for low switching activity
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    A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
    Seongmoon Wang, Sandeep K. Gupta
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