Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Several recent processor designs have proposed to enhance performance by increasing the clock frequency to the point where timing faults occur, and by adding error-correcting supp...
Brian Greskamp, Lu Wan, Ulya R. Karpuzcu, Jeffrey ...
Ensuring the correctness of multithreaded programs is difficult, due to the potential for unexpected interactions between concurrent threads. Much previous work has focused on det...
A major problem in detecting events in streams of data is that the data can be imprecise (e.g. RFID data). However, current state-ofthe-art event detection systems such as Cayuga ...
Existing spreadsheet systems allow users to change cells arbitrarily, which is a major source of spreadsheet errors. We propose a system that prevents errors in spreadsheets by re...
Martin Erwig, Robin Abraham, Irene Cooperstein, St...