126 search results - page 7 / 26 » Manufacturing industries need Design of Experiments (DoE) |
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
PROFES
2004
Springer
14 years 26 days ago
2004
Springer
Abstract. System architectures are described in abstract terms, often using Design Patterns. Actual reuse based on such descriptions requires that each development project derive a...
CHI
2007
ACM
14 years 8 months ago
2007
ACM
With the increasing number of cars on the road, longer commutes, and the proliferation of complex information and entertainment features, there is a greater need for careful inter...
WSC
1998
13 years 8 months ago
1998
The IBM Supply Chain Simulator (SCS) is a software tool that can help a company or a group of companies make strategic business decisions about the design and operation of its sup...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
- By putting different chips on the same mask, shuttle mask (or multiple project wafer) provides an economical solution for low volume designs and design prototypes to share the ri...