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DATE
2010
IEEE
171views Hardware» more  DATE 2010»
14 years 3 months ago
Digital statistical analysis using VHDL
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Manfred Dietrich, Uwe Eichler, Joachim Haase
WSC
2008
14 years 14 days ago
Knowledge-based event control for flow-shops using simulation and rules
The requirements on production systems and their planning and control systems are constantly growing. Systems have to be flexible and provide viable solutions at the same time. Di...
Mark Aufenanger, Wilhelm Dangelmaier, Christoph La...
EWCBR
2006
Springer
14 years 1 months ago
Case-Base Maintenance for CCBR-Based Process Evolution
The success of a company more and more depends on its ability to flexibly and quickly react to changes. Combining process management techniques and conversational case-based reason...
Barbara Weber, Manfred Reichert, Werner Wild
WSC
2001
13 years 11 months ago
Ford's power train operations: changing the simulation environment
This paper discusses the changes that were required to Ford's Power Train Operations (PTO) simulation environment to ensure the maximum benefit was gained from the investment...
John Ladbrook, Annette Januszczak
JMLR
2010
150views more  JMLR 2010»
13 years 5 months ago
Supervised Dimension Reduction Using Bayesian Mixture Modeling
We develop a Bayesian framework for supervised dimension reduction using a flexible nonparametric Bayesian mixture modeling approach. Our method retrieves the dimension reduction ...
Kai Mao, Feng Liang, Sayan Mukherjee