201 search results - page 30 / 41 » Manufacturing process management using a flexible modeling a... |
IPPS
2006
IEEE
14 years 3 months ago
2006
IEEE
This work presents a new approach to solve the location management problem by using the location areas approach. A combination of a genetic algorithm and the Hopfield neural netwo...
IHIS
2005
ACM
14 years 2 months ago
2005
ACM
The goal of this work is to contribute to the field of interoperability of Workflow models. To achieve this interoperability, we have built a generic architecture that s three lev...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
ENVSOFT
2006
13 years 9 months ago
2006
This paper presents an approach that integrates a legacy component into a software system for storm sewer simulation. The legacy component employed here is the Storm Water Managem...
WSC
2007
13 years 11 months ago
2007
Large scale / mega projects are lengthy complex endeavors that require significant planning by management, engineers and construction personnel to ensure the success of the projec...