Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ra...
Let NF(n, k, r) denote the maximum number of columns in an n-row matrix with entries in a finite field F in which each column has at most r nonzero entries and every k columns are...
A clique-transversal of a graph G is a subset of vertices that meets all the cliques of G. A clique-independent set is a collection of pairwise vertex-disjoint cliques. The clique...
Flavia Bonomo, Maria Chudnovsky, Guillermo Dur&aac...
We provide combinatorial algorithms for the unsplittable flow problem (UFP) that either match or improve the previously best results. In the UFP we are given a (possibly directed)...
We consider the problem of scheduling jobs on a pool of machines. Each job requires multiple machines on which it executes in parallel. For each job, the input specifies release ti...
Venkatesan T. Chakaravarthy, Vinayaka Pandit, Yogi...