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» Measuring Inhomogeneity in Spatial Distributions
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ICCAD
2009
IEEE
118views Hardware» more  ICCAD 2009»
13 years 5 months ago
Characterizing within-die variation from multiple supply port IDDQ measurements
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic
ICMLA
2008
13 years 9 months ago
Probabilistic Exploitation of the Lucas and Kanade Smoothness Constraint
The basic idea of Lucas and Kanade is to constrain the local motion measurement by assuming a constant velocity within a spatial neighborhood. We reformulate this spatial constrai...
Volker Willert, Julian Eggert, Marc Toussaint, Edg...
ICCAD
2006
IEEE
136views Hardware» more  ICCAD 2006»
14 years 4 months ago
An electrothermally-aware full-chip substrate temperature gradient evaluation methodology for leakage dominant technologies with
As CMOS technology scales into the nanometer regime, power dissipation and associated thermal concerns in high-performance ICs due to on-chip hot-spots and thermal gradients are b...
Sheng-Chih Lin, Kaustav Banerjee
CPHYSICS
2008
96views more  CPHYSICS 2008»
13 years 7 months ago
Moment distributions of clusters and molecules in the adiabatic rotor model
We present a Fortran program to compute the distribution of dipole moments of free particles for use in analyzing molecular beams experiments that measure moments by deflection in...
G. E. Ballentine, G. F. Bertsch, N. Onishi, K. Yab...
ICCV
2009
IEEE
15 years 19 days ago
Level Set Segmentation with Both Shape and Intensity Priors
We present a new variational level-set-based segmentation formulation that uses both shape and intensity prior information learned from a training set. By applying Bayes’ rule...
Siqi Chen and Richard J. Radke